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Authors: Z. Stanojevic, M. Karner, O. Baumgartner, H. W. Karner, C. Kernstock, H. Demel, F. Mitterbauer
Journal title: 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2016
Published pages: 65-67
DOI identifier: 10.1109/SISPAD.2016.7605149
ISBN: 978-1-5090-0818-6