TCAD-based characterization of logic cells: Power, performance, area, and variability

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Authors: HW. Karner, C. Kernstock, Z. Stanojevic, O. Baumgartner, F. Schanovsky, M. Karner, D. Helms, R. Eilers, M. Metzdorf

Journal title: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-2

DOI identifier: 10.1109/VLSI-TSA.2017.7942453

ISBN: 978-1-5090-5805-1