Insights on the Body Charging and Noise Generation by Impact Ionization in Fully Depleted SOI MOSFETs

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Authors: Carlos Marquez, Noel Rodriguez, Francisco Gamiz, Akiko Ohata

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/12

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 5093-5098

DOI identifier: 10.1109/TED.2017.2762733

ISSN: 0018-9383