Systematic method for electrical characterization of random telegraph noise in MOSFETs

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Authors: Carlos Marquez, Noel Rodriguez, Francisco Gamiz, Akiko Ohata

Journal title: Solid-State Electronics

Journal number: 128

Journal publisher: Pergamon Press Ltd.

Published year: 2017

Published pages: 115-120

DOI identifier: 10.1016/j.sse.2016.10.031

ISSN: 0038-1101