The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques

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Authors: J.-L. Rouviere, B. Haas, E. Robin, D. Cooper, N. Bernier, M. Williamson

Journal title: Microscopy and Microanalysis

Journal number: 23/S1

Journal publisher: Cambridge University Press

Published year: 2017

Published pages: 1414-1415

DOI identifier: 10.1017/S1431927617007735

ISSN: 1431-9276