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Authors: R. Carter, J. Mazurier, L. Pirro, J-U. Sachse, P. Baars, J. Faul, C. Grass, G. Grasshoff, P. Javorka, T. Kammler, A. Preusse, S. Nielsen, T. Heller, J. Schmidt, H. Niebojewski, P-Y. Chou, E. Smith, E. Erben, C. Metze, C. Bao, Y. Andee, I. Aydin, S. Morvan, J. Bernard, E. Bourjot, T. Feudel, D. Harame, R. Nelluri, H.-J. Thees, L. M-Meskamp, J. Kluth, R. Mulfinger, M. Rashed, R. Taylor, C. Weintraub
Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2016
Published pages: 2.2.1-2.2.4
DOI identifier: 10.1109/IEDM.2016.7838029
ISBN: 978-1-5090-3902-9
- Not specified