BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization

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Authors: F. Cacho, A. Cros, X. Federspiel, V. Huard, C. Roma

Journal title: 2016 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2016

Published pages: 7C-1-1-7C-1-6

DOI identifier: 10.1109/IRPS.2016.7574581

ISBN: 978-1-4673-9137-5