“Investigation of Hot Carrier reliability of SOI and sSOI transistors using Back Bias”

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Authors: G. Besnard, X. Garros, A. Subirats, F. Andrieu, X. Federspiel, M. Rafik, W. Schwarzenbach, G. Reimbold, O. Faynot, S. Cristoloveanu and C. Mazure

Journal publisher: VLSI-TSA Conference 2015 - International Symposium on VL Technology, Systems and Applications

Published year: 2015