Performance and reliability of strained SOI transistors for advanced planar FDSOI technology

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Authors: G. Besnard, X. Garros, A. Subirats, F. Andrieu, X. Federspiel, M. Rafik, W. Schwarzenbach, G. Reimbold, O. Faynot, S. Cristoloveanu

Journal title: 2015 IEEE International Reliability Physics Symposium

Journal publisher: IEEE

Published year: 2015

Published pages: 2F.1.1-2F.1.5

DOI identifier: 10.1109/IRPS.2015.7112691

ISBN: 978-1-4673-7362-3