Analysis and modelling of temperature effect on DIBL in UTBB FD SOI MOSFETs

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Authors: A. S. N. Pereira, G. de Streel, N. Planes, M. Haond, R. Giacomini, D. Flandre, V. Kilchytska

Journal title: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2016

Published pages: 116-119

DOI identifier: 10.1109/ULIS.2016.7440066

ISBN: 978-1-4673-8609-8