Threshold voltage and on-current Variability related to interface traps spatial distribution

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Authors: V. Velayudhan, J. Martin-Martinez, M. Porti, C. Couso, R. Rodriguez, M. Nafria, X. Aymerich, C. Marquez, F. Gamiz

Journal title: 2015 45th European Solid State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2015

Published pages: 230-233

DOI identifier: 10.1109/ESSDERC.2015.7324756

ISBN: 978-1-4673-7135-3