Direct Characterization of Impact Ionization Current in Silicon-on-Insulator Body-Contacted MOSFETs

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Authors: C. Marquez, N. Rodriguez, J. M. Montes, R. Ruiz, F. Gamiz, C. Sampedro, A. Ohata

Journal title: ECS Transactions

Journal number: 66/5

Journal publisher: Electrochemical Society, Inc.

Published year: 2015

Published pages: 93-99

DOI identifier: 10.1149/06605.0093ecst

ISSN: 1938-5862