Electrical characterization of Random Telegraph Noise in back-biased Ultrathin Silicon-On-Insulator MOSFETs

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Carlos Marquez, Noel Rodriguez, Francisco Gamiz, Akiko Ohata

Journal title: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2016

Published pages: 40-43

DOI identifier: 10.1109/ULIS.2016.7440047

ISBN: 978-1-4673-8609-8