Impact of S/D tunneling in ultrascaled devices, a Multi-Subband Ensemble Monte Carlo study

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Authors: C. Medina-Bailon, C. Sampedro, F. Gamiz, A. Godoy, L. Donetti

Journal title: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Journal publisher: IEEE

Published year: 2015

Published pages: 214-217

DOI identifier: 10.1109/SISPAD.2015.7292297

ISBN: 978-1-4673-7860-4