Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation

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Authors: Carlos Marquez, Noel Rodriguez, Francisco Gamiz, Rafael Ruiz, Akiko Ohata

Journal title: Solid-State Electronics

Journal number: 117

Journal publisher: Pergamon Press Ltd.

Published year: 2016

Published pages: 60-65

DOI identifier: 10.1016/j.sse.2015.11.022

ISSN: 0038-1101