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Authors: Luca Donetti, Carlos Sampedro, Francisco Gamiz, Andres Godoy, Francisco J. Garcia-Ruiz, Ewan Towiez, Vihar P. Georgiev, Salvatore Maria Amoroso, Craig Riddet, Asen Asenov
Journal title: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2015
Published pages: 353-356
DOI identifier: 10.1109/SISPAD.2015.7292332
ISBN: 978-1-4673-7860-4
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