Confinement orientation effects in S/D tunneling

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Authors: C. Medina-Bailon, C. Sampedro, F. Gamiz, A. Godoy, L. Donetti

Journal title: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2016

Published pages: 100-103

DOI identifier: 10.1109/ULIS.2016.7440062

ISBN: 978-1-4673-8609-8