Physical modeling - A new paradigm in device simulation

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Authors: Z. Stanojevic, O. Baumgartner, F. Mitterbauer, H. Demel, C. Kernstock, M. Karner, V. Eyert, A. France-Lanord, P. Saxe, C. Freeman, E. Wimmer

Journal title: 2015 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2015

Published pages: 5.1.1-5.1.4

DOI identifier: 10.1109/IEDM.2015.7409631

ISBN: 978-1-4673-9894-7