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Authors: V. Joshi, H. Ramamurthy, S. Balasubramanian, S. Seo, H. Yoon, X. Zou, N. Chan, J. Yun, T. Klick, E. Smith, J. Schmid, R. vanBentum, J. Faul, C. Weintraub
Journal title: 2017 Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2017
Published pages: T222-T223
DOI identifier: 10.23919/VLSIT.2017.7998179
ISBN: 978-4-86348-605-8
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