All Operation Region Characterization and Modeling of Drain and Gate Current Mismatch in 14-nm Fully Depleted SOI MOSFETs

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Authors: Theano A. Karatsori, Christoforos G. Theodorou, Emmanuel Josse, Charalabos A. Dimitriadis, G. Ghibaudo

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 2080-2085

DOI identifier: 10.1109/TED.2017.2686381

ISSN: 0018-9383