Evidence of Time-Dependent Vertical Breakdown in GaN-on-Si HEMTs

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Authors: Matteo Borga, Matteo Meneghini, Isabella Rossetto, Steve Stoffels, Niels Posthuma, Marleen Van Hove, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 3616-3621

DOI identifier: 10.1109/TED.2017.2726440

ISSN: 0018-9383