Exploring the thermal limit of GaN power devices under extreme overload conditions

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Authors: F.P. Pribahsnik, M. Nelhiebel, M. Mataln, M. Bernardoni, G. Prechtl, F. Altmann, D. Poppitz, A. Lindemann

Journal title: Microelectronics Reliability

Journal number: 76-77

Journal publisher: Elsevier BV

Published year: 2017

Published pages: 304-308

DOI identifier: 10.1016/j.microrel.2017.07.046

ISSN: 0026-2714