Analysis of multifinger power HEMTs supported by effective 3-D device electrothermal simulation

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Authors: Aleš Chvála, Juraj Marek, Patrik Príbytný, Alexander Šatka, Steve Stoffels, Niels Posthuma, Stefaan Decoutere, Daniel Donoval

Journal title: Microelectronics Reliability

Journal number: 78

Journal publisher: Elsevier BV

Published year: 2017

Published pages: 148-155

DOI identifier: 10.1016/j.microrel.2017.08.012

ISSN: 0026-2714