Determination of the Self-Compensation Ratio of Carbon in AlGaN for HEMTs

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Authors: Ben Rackauskas, Michael J. Uren, Steve Stoffels, Ming Zhao, Stefaan Decoutere, Martin Kuball

Journal title: IEEE Transactions on Electron Devices

Journal number: 65/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 1838-1842

DOI identifier: 10.1109/ted.2018.2813542

ISSN: 0018-9383