Degradation of p-GaN HEMTs exposed to clamped inductive switching

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Authors: Juraj Marek, Martin Jagelka, Jozef Kozárik, Aleš Chvála, Patrik Príbytný, Alexander Šatka, Martin Donoval, Daniel Donoval and Ľubica Stuchlíková

Journal title: GaN Marathon 2018

Journal publisher: Cleup sc

Published year: 2018

ISBN: 978-88-6787-916-8