Study of trapping in GaN-based power HEMTs based on High-Voltage Double-Pulsed Backgating Measurement System

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Authors: M. Ruzzarin, A. Barbato, M. Meneghini, I. Rossetto, M. Silvestri, O. Haeberlen, T. Detzel, G. Meneghesso, E. Zanoni

Journal title: 41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe

Journal publisher: IUMA

Published year: 2017