Impact of repetitive UIS on modern GaN power devices

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Authors: Juraj Marek, Lubica Stuchlikova, Martin Jagelka, Ales Chvala, Patrik Pribytny, Martin Donoval, Daniel Donoval

Journal title: 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM)

Journal publisher: IEEE

Published year: 2016

Published pages: 173-176

DOI identifier: 10.1109/ASDAM.2016.7805923

ISBN: 978-1-5090-3083-5