Statistical Analysis of the Impact of Anode Recess on the Electrical Characteristics of AlGaN/GaN Schottky Diodes With Gated Edge Termination

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Authors: Jie Hu, Steve Stoffels, Silvia Lenci, Brice De Jaeger, Nicolo Ronchi, Andrea Natale Tallarico, Dirk Wellekens, Shuzhen You, Benoit Bakeroot, Guido Groeseneken, Stefaan Decoutere

Journal title: IEEE Transactions on Electron Devices

Journal number: 63/9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2016

Published pages: 3451-3458

DOI identifier: 10.1109/TED.2016.2587103

ISSN: 0018-9383