A Novel System to Measure the Dynamic On-Resistance of On-Wafer 600 V Normally-Off GaN HEMTs in Real Application Conditions

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Authors: A. Barbato, M. Barbato, M. Meneghini, M. Silvestri, T. Detzel, O. Haeberlen, G. Meneghesso, E. Zanoni

Journal title: 41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe

Journal publisher: IUMA

Published year: 2017