Gate Stability of GaN-Based HEMTs with P-Type Gate

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Authors: Matteo Meneghini, Isabella Rossetto, Vanessa Rizzato, Steve Stoffels, Marleen Van Hove, Niels Posthuma, Tian-Li Wu, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni

Journal title: Electronics

Journal number: 5/2

Journal publisher: MDPI

Published year: 2016

Published pages: 14

DOI identifier: 10.3390/electronics5020014

ISSN: 2079-9292