THz Characterization and Modeling of SiGe HBTs: Review (Invited)

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Authors: Sebastien Fregonese, Marina Deng, Marco Cabbia, Chandan Yadav, Magali De Matos, Thomas Zimmer

Journal title: IEEE Journal of the Electron Devices Society

Journal number: 8

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2020

Published pages: 1363-1372

DOI identifier: 10.1109/jeds.2020.3036135

ISSN: 2168-6734