Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity

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Authors: S. Balanethiram, A. Chakravorty, R. D’Esposito, S. Fregonese, D. Céli, T. Zimmer

Journal title: IEEE Transactions on Electron Devices

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

ISSN: 0018-9383