Hot-Carrier Degradation in SiGe HBTs: A Physical and Versatile Aging Compact Model

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Authors: Chhandak Mukherjee, Thomas Jacquet, Gerhard G. Fischer, Thomas Zimmer, Cristell Maneux

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/12

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 4861-4867

DOI identifier: 10.1109/ted.2017.2766457

ISSN: 0018-9383