A 140 GHz to 160 GHz active impedance tuner for in-situ noise characterization in BiCMOS 55 nm

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Simon Bouvot, Joao Carlos Azevedo Goncalves, Alice Bossuet, Thomas Quemerais, Sylvie Lepilliet, Guillaume Ducournau, Francois Danneville, Daniel Gloria

Journal title: 2017 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

Journal publisher: IEEE

Published year: 2017

Published pages: 153-155

DOI identifier: 10.1109/RFIT.2017.8048233

ISBN: 978-1-5090-4036-0