A D-band passive receiver with 10 dB noise figure for in-situ noise characterization in BiCMOS 55 nm

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Simon Bouvot, Thomas Quemerais, Joao Carlos Azevedo Goncalves, Sylvie Lepilliet, Guillaume Ducournau, Francois Danneville, Daniel Gloria

Journal title: 2017 IEEE 17th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)

Journal publisher: IEEE

Published year: 2017

Published pages: 107-110

DOI identifier: 10.1109/SIRF.2017.7874385

ISBN: 978-1-5090-5237-0