Low Frequency Noise in advanced 55nm BiCMOS SiGeC Heterojunction Bipolar Transistors: Impact of collector doping

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Authors: B. Sagnes, F. Pascal, M. Seif, A. Hoffmann, S. Haendler, P. Chevalier, D. Gloria

Journal title: 2017 International Conference on Noise and Fluctuations (ICNF)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-4

DOI identifier: 10.1109/ICNF.2017.7986001

ISBN: 978-1-5090-2760-6