Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range

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Authors: Chandan Yadav, Marina Deng, Magali De Matos, Sebastien Fregonese, Thomas Zimmer

Journal title: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

Journal publisher: IEEE

Published year: 2018

Published pages: 197-201

DOI identifier: 10.1109/icmts.2018.8383798

ISBN: 978-1-5386-5071-4