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Authors: Julien Borrel, Alexis Gauthier, Fabien Deprat, Vincent Lu, Francesco Abbate, Sylvain Joblot, Laurent-Renaud Clement, Heloise Tupin, Wei Zou, Edwin Arevalo, Pascal Chevalier, Didier Dutartre
Journal title: 2018 22nd International Conference on Ion Implantation Technology (IIT)
Journal publisher: IEEE
Published year: 2018
Published pages: 29-32
DOI identifier: 10.1109/iit.2018.8807965
ISBN: 978-1-5386-6829-0