Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit

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Authors: C. Mukherjee, T. Jacquet, A. Chakravorty, T. Zimmer, J. Boeck, K. Aufinger, C. Maneux

Journal title: Microelectronics Reliability

Journal number: 73

Journal publisher: Elsevier BV

Published year: 2017

Published pages: 146-152

DOI identifier: 10.1016/j.microrel.2017.05.001

ISSN: 0026-2714