On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands

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Authors: Sebastien Fregonese, Magali De matos, Marina Deng, Manuel Potereau, Cedric Ayela, Klaus Aufinger, Thomas Zimmer

Journal title: IEEE Transactions on Microwave Theory and Techniques

Journal number: 66/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 3332-3341

DOI identifier: 10.1109/tmtt.2018.2832067

ISSN: 0018-9480