Comparison of On-Wafer TRL Calibration to ISS SOLT Calibration With Open-Short De-Embedding up to 500 GHz

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Authors: Sebastien Fregonese, Marina Deng, Magali De Matos, Chandan Yadav, Simon Joly, Bernard Plano, Christian Raya, Bertrand Ardouin, Thomas Zimmer

Journal title: IEEE Transactions on Terahertz Science and Technology

Journal number: 9/1

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 89-97

DOI identifier: 10.1109/tthz.2018.2884612

ISSN: 2156-342X