On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization

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Authors: Joao CarlosAzevedo Goncalves, Issa Alaji, Daniel Gloria, Vincent Gidel, Frederic Gianesello, Sylvie Lepilliet, Guillaume Ducournau, Francois Danneville, Christophe Gaquiere

Journal title: 2018 48th European Microwave Conference (EuMC)

Journal publisher: IEEE

Published year: 2018

Published pages: 37-40

DOI identifier: 10.23919/eumc.2018.8541387

ISBN: 978-2-87487-051-4