Impact of on-Silicon De-Embedding Test Structures and RF Probes Design in the Sub-THz Range

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Authors: Chandan Yadav, Marina Deng, Sebastien Fregonese, Magali DeMatos, Bernard Plano, Thomas Zimmer

Journal title: 2018 48th European Microwave Conference (EuMC)

Journal publisher: IEEE

Published year: 2018

Published pages: 21-24

DOI identifier: 10.23919/eumc.2018.8541392

ISBN: 978-2-87487-051-4