Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions

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Authors: Mathieu Jaoul, David Ney, Didier Celi, Cristell Maneux, Thomas Zimmer

Journal title: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

Journal publisher: IEEE

Published year: 2019

Published pages: 33-37

DOI identifier: 10.1109/icmts.2019.8730951

ISBN: 978-1-7281-1466-8