On the Variation in Short-Open De-embedded S-parameter Measurement of SiGe HBT upto 500 GHz

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Chandan Yadav, Sebastien Fregonese, Marina Deng, Marco Cabbia, Magali De Matos, Thomas Zimmer

Journal title: 2019 12th German Microwave Conference (GeMiC)

Journal publisher: IEEE

Published year: 2019

Published pages: 264-267

DOI identifier: 10.23919/gemic.2019.8698153

ISBN: 978-3-9812668-9-4