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Authors: Marine Couret, Gerhard Fischer, Sebastien Fregonese, Thomas Zimmer, Cristell Maneux
Journal title: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
Journal publisher: IEEE
Published year: 2019
Published pages: 154-159
DOI identifier: 10.1109/icmts.2019.8730964
ISBN: 978-1-7281-1466-8
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