Methods for Determining the Collector Series Resistance in SiGe HBTs—A Review and Evaluation Across Different Technologies

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Authors: Andreas Pawlak, Julia Krause, Michael Schroter

Journal title: IEEE Transactions on Electron Devices

Journal number: 65/9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 3588-3599

DOI identifier: 10.1109/ted.2018.2853092

ISSN: 0018-9383