On the use of Drift-Diffusion and Hydrodynamic Transport Models for Simulating the Negative Differential Mobility Effect

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Authors: G. Wedel, T. Nardmanrr, M. Schroter

Journal title: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/bcicts.2018.8550970

ISBN: 978-1-5386-6502-2