Modeling High-Current Effects in Bipolar Transistors: A Theory Review

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Authors: M. Schroter, S. Falk

Journal title: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Journal publisher: IEEE

Published year: 2018

Published pages: 219-222

DOI identifier: 10.1109/bcicts.2018.8551078

ISBN: 978-1-5386-6502-2