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Authors: Pietro Monsurro, Alessandro Trifiletti, Leopoldo Angrisani, Mauro D'Arco
Journal title: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-6
DOI identifier: 10.1109/i2mtc.2017.7969823
ISBN: 978-1-5090-3596-0